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Questions related from Mahesha M G
I am using Profex software to analyze XRD. It works fine for materials whose .str file are available in package. But fails when I use imported .str I downloaded .cif file and converted to...
03 March 2018 7,373 5 View
How to quantify the defect state density from PL spectra for a semiconducting thin film?
04 April 2017 4,446 6 View
I have list of papers in DOI/EID form. Can I get publication month/year and impact factor of the corresponding journals? May be by using SciVal or Scopus
01 January 2017 6,438 0 View
Whether II-VI compound semiconductors exhibit metal-insulator transition (R-T measurement) at very low temperature (10K to 50K)
04 April 2016 2,800 0 View
I would like to simulate bi-layer thin film transmittance. Any free software?
02 February 2016 3,037 11 View
I have Raman data for thin films deposited under the same condition but that have undergone different post-deposition treatments. Along with peak shifts, there is a considerable change in peak...
03 March 2014 1,901 5 View
I have thin film samples whose composition is known. When samples were sent for Raman Spectroscopy, operator is for the asking scan range. How do I decide it?
06 June 2013 6,472 5 View
Difference between amorphous, quasi-crystalline and crystalline state.
06 June 2013 6,692 4 View
I have absorbance, reflectance% and transmittance% data. How to calculate refractive index from this. I tried with R = [(n - 1)^2 + K^2 ] / [(n + 1)^2 + K^2] where K is extinction coefficient....
12 December 2011 2,712 24 View