Akhil Gopalakrishnan

4 Questions 11 Answers 0 Followers

Questions related from Akhil Gopalakrishnan

Is there any standard mathematical fitting procedure for measuring RMS roughness from AFM images?

While performing RMS roughness analysis, some researchers prefer bow/tilt correction and plane fitting etc. But most of the reports do not seem to follow a standard procedure. What is the meaning...

18 February 2016 3,837 8 View

Should I reconsider the fitting model if I got dissimilar thicknesses for polymer films on Si wafer at multiple angles of incidence?

While measuring the thickness of polymer thin film on Silicon wafer using spectroscopic ellipsometry, I am getting a thickness of 50 nm at 65 deg, 120 nm at 70 deg and 125 nm at 75 degree, for the...

06 January 2015 7,546 6 View

Are there any free softwares to fit a Nyquist plot from impedance spectroscopy?

I am trying to fit a Nyquist plot of polymer membranes. How can I fit the data? How do I know that the fit is good or not (other than by looking at the fit)?

01 July 2014 7,953 10 View

How to calculate refractive index of a polyelectrolyte in a multilayer thin film using ellipsometry?

I assume that the method for measuring thickness and refractive index is the same, but the fitting model is different. I am using J. A. Woollam spectroscopic ellipsometer, with complete ease software.

13 November 2013 9,837 0 View