This concept is associated with a scanning probe microscope with the help of feedback. The response of the feedback system on the occurrence of the error signal Vfb = V (t) -
VS is determined by a constant feedback loop K (in the instrument NanoEducator - Feed Back
Loop Gain) or several such constants. Specific values of K depend on the
design features specific SPM (construction and characteristics of the scanner,
Electronic) mode AFM (scan size, scan rate, etc.), as well as
characteristics of the studied surface (roughness, scale features
topography, material hardness, etc.).
In general, the higher the K value the more precise feedback circuit fulfills the features
the scanned surface and the more reliable the data obtained by scanning.
However, above a certain critical value K feedback system
shows a tendency to self, ie, line scan occurs
noise pollution.
Thanks Mis for your response, in fact the concept of CZM in fracture mechanics is whidly used since the simple formulation of the phenomenological cohesive models is advantageous when it is coupled with analytical and/or numerical approachs, the parameters that caracterise the cohesive model are determined experimentaly, and it is intressting to study the Datas evailable now in order to range the values of these parameters for further developement of simple formulation numerical and analytical tools, it is believed that cohesive models formulated in term of the critical stress vs critical crack opening jump need answers about the size of these critical parameters that caracterise the CZM of the studied material, examining the experimetal datas in metalic materials for example can give answers about the range of the critical values in this class of materials
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