By using XRD patterns, you can obtain crystalline structure of nanomaterials. But, with EDX spectroscopy, one can confirm purity and determine contents of elements in materials.
If you are needing elemental analysis then you will need to use EDS analysis. XRD will give you information on the crystalline components present in your composites but won't tell you the elemental composition. EDS analysis meanwhile will tell you the elemental composition, but won't tell you necessarily how those elements are combined with one another. EDS mapping may give you an indication of phase assemblages, but the resolution can sometimes be a problem in very heterogeneous materials.
What Leon Black mentioned is true. From XRD you can get the crystallography and calculate size of the particles. You can also get which phase has been formed. With EDS you can get only compostion and you can see wether all the elements you required are there. So there's a big difference between them.
The answers provided above are valid. EDX determines elemental composition while XRD can be used determine crystallographic properties such has crystal structures, lattice parameters, phases present in the material among others.
Both the techniques are based on X rays. In EDS the X rays are generated due to interaction between electron beam and the sample. Their intensities as a function of energy are monitored. Each element has a specific "fingerprint" energy level. Thus one can indentify what elements are present along with quantification. EDS maps can be acquired to get the elemental distribution. At the same time it has to be noted that this technique is not super accurate and needs supplementary supporting techniques such as XRD. In addition light elements below barium need special window/windowless setup for detection.
XRD is also a X ray baesd technique where the material interacts with X ray beam of specific wavelength. The beam gets scattered depending on the crystal structure of the sample and generates a plot having intensity as a function of 2 theta. So it can give phases as well as quamtities in terms of relative intensity. You can also get average crystallite size (for eg Joshi, Sameehan S., et al. "Dynamic crystallization during non-isothermal laser treatment of Fe–Si–B metallic glass." Journal of Physics D: Applied Physics 48.49 (2015): 495501.) and stresses in the sample. XRD is relatively simple yet versatile technique. Read Cullity's book for further details.
For your projects you would do XRD for phase identification and EDS along with SEM for elemental distributions and morphology.
With XRD technique you can identify crystallographic phases of materials prepared and it can also provide information on unit cell dimensions. Then you can do elemental composition with EDS which works in conjunction with SEM for surface morphology.
XRD used for Crystalline, amorphous, ordered-disordered molecular arrangement properties of material. whereas, EDS generally do with a Scanning electron microscopy study which provides information regarding the elemntal composition of material.
XRD gives the phases that are formed due to the processing of material. Whereas EDS analysis gives the elemental composition n the selected area or point. XRD, however, does not give the quantity of a phase that is formed.
If one doesn't know the proper composition of a material, he has to go for EDS analysis initially. After this he might know the proper percentages of elements in the material. For e.g. ZnO will give nearer atomic percentages after this analysis. Hence one can confirm the compound was ZnO
But, Zn and O have different types of arrangements in compounds called as hexagonal wurtzite and cubic zinc blende. As these two types of arrangements give same percentage in EDS analysis, we have to go for crystalline studies with XRD. After XRD, the results can be easily matched with existing JCPDS files to find the crystal system of the material.
After these two analysis, one can boldly tell "this was my material"
If you are working with composites, there will be more than one crystalline material.
The Al atoms are arranged in one structural arrangement and the reinforcement atoms may or maynot substitute the Al atoms. This may cause a variation in peak positions in XRD (or) formation of additional phases in the XRD.
The structural property of the material being studies is obtained from X-ray diffraction which reveals prominent peaks from which the average grain size can be estimated using Debye Sherrer formula. EDS gives the elemental composition just like XRF.
XRD is used for to determine the crystalline structure of the components of the sample while EDS used to fined out the elemental composition of the sample.
X-ray powder diffraction (XRD) is a rapid analytical technique primarily used for phase identification of a crystalline material and can provide information on unit cell dimensions. The analyzed material is finely ground, homogenized, and average bulk composition is determined. Purpose to use XRD is the one of the most efficient methods by which the quantitative determination of internuclear distances can be successfully made.
Importance of XRD
The wavelength of X-rays is on the atomic scale, so X-ray diffraction (XRD) is a primary tool for probing structure of nano-materials. XRD offers unparalleled accuracy in the measurement of atomic spacing and is the technique of choice for determining strain states in thin film
Differences between XRD and EDS
1. EDS is used for chemical identification of elements and their concentration. Generally, XRD is used to identify spatial arrangements of atoms in crystalline phases.
2. In EDS, electrons knock out electrons from atoms, producing X-rays of characteristic wavelength. These X-Rays are then detected to identify the element from which they were produced. In XRD, X-rays of known wavelength are used to probe the structure of the material, using the lattice as a diffraction grating.
3. EDS is used in conditions when you are only in need of the chemical composition of a material. XRD on the other hand gives far more information than an EDS, It is possible to perform chemical analysis using an XRD but not to the degree as in an EDS. But, if you are also need to know the crystal structure, the lattice parameter or the interplanar distance etc... Accurately you must go in for an XRD as the EDS has no provision to provide such information. For determination of unit cell parameters, each reflection must be indexed to a specific hkl.
EDS - gives the composition of elements in the substance or material while XRD analysis identifies the phases present in the sample substance and helps you calculate the crystallite size
XRD gives information on phase (chemical compounds) present in a material, EDS gives data about elemental composition of a material. EDS is usually coupled with an SEM or TEM, while XRD data are generated from separate XRD machines.
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