Dear all,

I am looking for an instrument which allows me to measure the reflectance from solid interface coated with a thin film as a function of the wavelength and the angle of incidence. I will need this instrument to quantify the color change of the coated wafer in response to an applied external stimulus. The determination of the film thickness with the given instrument is not absolutely necessary, as I do have other instruments available (monocromatic ellipsometer, X-ray reflectometer), but would be advantageous.

As far I could learn from googleing around, I could use a spectroscopic reflectometer, which allows to measure the reflectance at normal incidence and as a function of the wavelength. If I want to record the reflectance as a function of the incidence angle, I will need to opt for a spectroscopic ellipsometer. The latter are, however, usually much more expensive and my budget is limited to 40-45 k€ final price (That's however the very upper limit, something in the 30-35 k€ would be better).

Could you please suggest or recommend an affordable instrument, which allows to simply record the reflectance as a function of wavelength and angle of incidence? Or are there other options to think about to quantify the color change associated to the swelling of the thin film?

Thanks,

Leonardo

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