The generally used methods of determining charge carrier mobility in thin films (Time of Flight TOF, steady state SCLC analysis, Transient SCLC (Dark injection) , Carrier Extraction by Linearly Increasing Voltage (CELIV), Impedance spectroscopy are related to space-charge concept - the extraction/collection of charge carriers before they are relaxed (dielectric relaxation). Mathematically, all these techniques require 

d^2/mu-V

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