01 January 1970 10 1K Report

Hi together, 

when I worked in Roy Sambles' Thin Films & Interfaces Group in Exeter in 1993 I used an existing Fortran program for multilayer Fresnel modelling and improved its slo-mo performance to the point where one could change the parameters of the layers and see an almost instant graphical response. This actually gave rise to the "Inverted SPR" discovery.

Now, since then I was wondering if it wasn't feasible to have the computer scan a huge parameter space on its own and essentially doing a "curve discussion" on its own: A new phenomenon or quality can be described in natural language terms and so can known patterns be described (how are minima, maxima distributed, what are known limits, etc.) as well. The latter would have to be told to the computer and then it would only start spitting out results if it found something remarkable, something outside the known patterns. With today's computing power such a generic software tool would have produced the ISPR instantly! Now I would like to pass on the suggestion: create or find a method to describe and detect patterns in modelled data. Then let a computer scan the areas you find interesting? What do you think? Or is it standard procedure nowadays to do this?

Cheers from Switzerland 

Marc

Similar questions and discussions