I am looking for a samples to tests my DLTS and admittance setup and analysis. A Schottky diodes or n++p or p++n are also good. Please contact me for details, comments and suggestions. For information: DLTS and admittance are useful to probe electrically active defects.
Sample with recorded data (Only admittance measurement)? ([email protected])
A commercially available diode is a good choice. SiC is a good choice for a test, or standard, diode. For example, try CREE SiC diode, part number C3D02060A. It is also available in die form. 8065 is a larger diode with higher capacitance.
The diode has relatively low concentration, so that it is useful for both DLTS at higher temperatures, and thermal admittance spectroscopy over a broad range of temperature.
The traps in SiC are mostly acceptors, meaning that field dependence will not cause the spectrum to shift or broaden from Poole-Frenkel effect.
Dear Dan
thank you for this idea! I will try this way!
Did you work in the area of capacitance and related techniques?
Arouna
I started with DLTS in 1991. Since then, I put systems together for labs where I worked, and then started my own niche business. The systems are now based around DLTS, I-DLTS, IVT, TAS.
It would be good to share spectra from the SiC, come to some consensus about the trap characteristics, for a true standard sample that is readily available. I have only recently started using the sample mentioned above, as a better option than Si 1N4001 diodes.
Dear Dan,
Thanks.
Wow, great experience! I will send you an private mail to go deep in discussion!
Arouna
DearArouna,
Indeed defects and the levels they cause in the bandage energy of a pv absorber can be very detrimental to solar cell efficiency. Artur mentioned some methods but unfortunately these are not sensitive enough to detect concentrations in the order of 1e10-1e13/cm3, in term of defects, which can already lower performance substantially. The best known technique to do so is called DLTS. I think your best starting reference to learn about it is Semiconductor Material and Device Characterization (Wiley - IEEE) 3rd by Dieter K. Schroder . I just found it available in http://www.optima.ufam.edu.br/SemPhys/Downloads/Dieter.pdf
Check out Chapter 5 and 6. For example this plot for deciding what sort of impedance/admittance spectroscopy method to use.
Reference 20-38 in Ch5 are all pretty good. Specially for example, Anthony. R. Peaker is still actively working in the subject (ref 38, probably one of the initial papers on it).
After reading this, I think the next best reference is the book of Nicoliand and Brews: https://www.amazon.com/Metal-Oxide-Semiconductor-Physics-Technology/dp/047143079X
I hope this helps.
Good luck.
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