My company is looking to buy an ICP to scan and quantify impurities in semiconductors in the ppt concentration. We reached the point where we need to decide between ICP-oTOFMS and ICP-QQQ. What would you suggest for this application?
I’d suggest ICP QQQ MS for better detection limits and ability to overcome many interferences that might be relevant to your analyses.
we have an Agilent 8900 and have been very happy with it. There are certain types of analyses we perform that wouldn’t be possible with the typical sensitivity of an ICP-TOF instrument.