Since your material (Chitosan) is semicrystalline you can use X-Ray diffraction method to study the particle size distribution and Fourier Transform Infrared Spectroscopy (FTIR) can also be used to study the possible chemical interactions between the components present in your sample.
XRD would measure crystallite size (via the Scherrer or Williamson-Hall routes) if the crystallites are < 100 nm approx. and not 'particle size'... There are no particles to measure except perhaps in a solution prior to dip or spin coating.
It's a thin film so ellipsometry and step height measurement seems the likely applicable techniques.
The objective of this measurement is to make sure that edible coating (Chitosan-Gallic Acid based), which will be sprayed at a later stage is homogeneous. So considering this, wondering if you would still recommend ellipsometry Alan F Rawle or are there any other I could use??
One can look at the heterogeneity of the film with RI and thickness variation. A step profiler would be very useful. With ellipsometry with assumption of the RI then the thickness can be calculated. With a knowledge of the thickness the RI can be determined. How thick is the film roughly? Is it opaque, translucent or transparent?
Thank you again!! I have not determined the thickness of the coating yet, as I am not spraying on a food material at the moment.
I assume that it is going to be a transparent film on the food products, as it is a clear solution. As of now we are treating and performing other experiments as a coating solution.