I am preparing to start working on thin film transistor (TFT) devices from metal oxides. In literature I have seen most people use semiconductor parameter analyzers for measuring drain current as a function of drain voltage and gate voltage. We do not have this apparatus in our lab, but we have Autolab PGSTAT30/2 setup that we use for solar cell IV and Impedance/admittance spectroscopy measurements.
I was wondering if it is possible to use this Autolab to characterize TFT devices.
Solar cell IV is two-terminal measurement. TFT IV is three-terminal one.
I have not use Autolab before so I do not know its spec. As long as it satisfies two conditions I think you can use it to measure TFT IV:
1) High current sensitivity: you should be able to measure at least in nA scale in order to record OFF current. My Keithley can measure up to pA.
2) Three-terminal input/output. It's quite obvious right.
Good luck.
Hung thanks for your response. For condition 1) yes it can, but for condition 2), I have not had the possibility of doing three terminal measurements with Autolab. I thought maybe someone out there might have done this and could give me some tips. May be i should look for another alternative.
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