I recently conducted a scan of several samples using the K-Alpha Compact XPS from Thermo Scientific, but noticed after the first sample that the scanning interval for lanthanum was not set properly (as in, scanning was cut at 855 eV and this lies in the middle of a multiplet peak). I could not adjust the interval during the measurement, so I performed a subsequent experiment in which I would only redo the scan for lanthanum.
Now the question. I have two experiment files now, but so far I've only been able to select one experiment at a time for analysis. Is there a way to work with both data sets at the same time in the Avantage software?
A Quick way in avantage is top drop you VGD files in to 2 different processing windows and drag one file in to the other
But of you have the 3d5/2 peak (between roughly 830 and 845 eV) then I would just use that - just need to assign the peak as La3d5/2 in Avantage to use the correct sensitivity factor. You may find it to be more accuarate since the background for La rises quite a lot after the 5/2 peaks
Hi David,
I think the answer to your question is YES.
The avantage software allows you to open many processing views. Each processing view allows to load a set of spectra from one experiment.
Is not a good idea mix different experiments in the same processing just because some corrections should be done to the data before to compare two experiments. ,
Then once you have each set of data in separated processing view, correct the peak positioning by charge referencing the C1s peak.
Once you have your data corrected you can even open a new processing view and you can copy and drop any spectrum from any experiment and you can compare it, overlappping, or whatever.
Ídon´t now if this enough clear for you.
If you need more details I can prepare a short word document.
Good luck with the analysis.
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