I measured C-V by changing the frequency from 10kHz to 1MHz. Typically, jigger frequencies have lower capacitance compared to 10kHz at the accumulation regime of Al/HfO2/p-Si MIS-diode. In this time, 1MHz frequency shown higher accumulation capacitance around 1uF/cm2 compared to 10kHz. What is the mechanism of this reverse C-V characteristics dependence on the frequency?
Dear Nithi,
Can you tell us how did you measure the device capacitance?. Because of the nonlinear behavior of the C-V characteristics, you must be sure of the existence of small signal conditions.
Dear Abdelhalim,
Thanks for the reply.
The root cause for that trouble come from the measurement system. We set up the probe and checked the cable. Now the C-V characteristic is normal as 1 MHz has lower capacitance compares to 10 kHz. Yes I measured the device capacitance.
Okay Nithi, this i why i asked you if you measure the device capacitance or something else.This means that you acquired other capacitances with the device. My diagnosis is not bad.
wish you success.
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