I know EBSD gives us Euler angles for a polycrystalline material, but I am wondering if there is any statistical way to calculate Euler angles from SEM images.
Unfortunately, no. It is necessary to collect an electron backscatter diffraction pattern to determine the crystallographic orientation. A standard secondary electron or backscatter electron collector in a SEM simply does not have the capability for this.
However, the morphology of a grain can give some suggestions as to the orientation of certain crystallographic planes - for instance, the direction of a steel martensitic lath can be distinguished from an SE image taken from a properly polished and etched specimen and it gives a rough trace of the (111)austenite and (011)martensite interfacial plane.
Thanks for your reply but any clue how we can have that rough estimate of orientation plane for the grains let's say for silver? Shall we go for some kinda comparison study?
Hi Mehdi,
I suggest that you check out these papers:
- Brighton et al., "Tutorial: Crystal orientations and EBSD — Or which way is up?", 2016 available from http://www.sciencedirect.com/science/article/pii/S1044580316300924
- Groeber et al., "3D reconstruction and characterization of polycrystalline
microstructures using a FIB–SEM system", 2006: https://cmrl.jhu.edu/wp-content/uploads/sites/74/2015/11/2006_MaterialsCharacterization_57.pdf
- Groeber et al., "A framework for automated analysis and simulation of 3D polycrystalline microstructures. Part 1: Statistical characterization", 2008: https://cmrl.jhu.edu/wp-content/uploads/sites/74/2016/07/2008-acta-mat-1.pdf
Regards
- Badges
- Science topic
- Similar topics
- Physical Sciences
- Materials Science