I have a semiconductor thin film with a bandgap of 2.1 eV well adhered over the quartz substrate and I am trying to calculate the dielectric constant of the material within 200 nm - 800 nm wavelength´s region. On the total absorption spectrum material is showing a strong absorption from 800nm - 590nm. But from 590 nm to 200 nm absorption is small but some intereference patterns appear due to the interfaces.I am using WinElli 2.2.0.6 for ellipsometry measurements. May someone help me to use Tauc Lorentz model or Forouhi-Bloomer model to fit the complete wavelength range. I would highly appreciate if someone help me for data fitting or share a video showing the data fitting on WinElli 2.2.0.6 or any other software. Looking forward for someone´s positive response and thanking in anticipation.
Hello Lukas,
I am thankful for your quick and detailed answer. The film is crystalline with a grain size around 40 nm. The thickness was calculated by perfilommetry which is about 900 nm and it is confirmed by Cauchy model too. I have divided the data in to two parts one having strong absorption 590nm-200nm where the parameters are fit using a simple approach. However, from 590nm - 800nm, due to the patterns like fringes on the absorptions spectrum i tried the Cauchy Model. And by Cauchy model real dielectric constant was found to be in between 8 and 9. Later, I combine them but at the point where they are combined they totally mis-match. I was wondering which model i may use to fit the whole data range irrespctive of thinking the absorption. Which model do you suggest to fit the data for the whole wavelength range 200nm-800nm. Later, i may upload the ellipsometry data.Thanks in advance.
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