Is there anyone in the II-VI CSC world aware of any efforts being directed towards the establishing of industry standards for procedures to determine dislocation etch pit densities of CdTe and CdZnTe, along the lines of SEMI M83-113 for the III-Vs (or at least some industry consensus on the preferred method)? Not so much the etching processes which are well documented in the literature, but in the (manual) counting procedures to provide objective and comparative data.
Thank you for your interest and comments.
Dear Brian,
Maybe you should contact my earlier Uppsala colleague Prof. Leslie Pendrill at the SP Technical Research Institute of Sweden, SP Measurement Technology. His contact points are listed on his RG page.
With best regards
Erkki Brändas
Former director of the Graduate School, Advanced Instrumentation and Measurements (AIM) Uppsala University
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