Aging tests in multilayered sputtered films using time temperature superposition method.
Why not using an Arrhenius plot? Assume decay reactions (first order), determine the decay constant at different temperatures, plot vs. 1/T.
My doubt is lied to the fact that in a multilayered nanometric solid structure, subjected to annealing, there are a lot of concomitant reactions, whose temperature dependence can be different (e.g. nucleation and growth of new phases) and the method TTSP assumes Ea constant in the considered (usually 100-200 °C) range. The problem is exactly if assumption of the order is applicable in solid kinetic studies.
The degradation might be complex, nevertheless, there might be a dominant component, maybe resulting in "first-order-like" behaviour.
I would recommend to assume a reaction order and try whether your data fits an Arrhenius plot. If you get a linear plot, postulate your assumption true.
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