You should follow time domain approach. With plane wave excitation measure the scattering characteristics of the incident wave. If you are using waveguide ports then measure the transmission and reflection coefficients.
You can set the electric and magnetic monitoring in the frequency of interest and check the field propagation as well.
Hi Awanish Kumar ,
In addition to what has been mentioned by Krunal Patel , you can use some electric field/magnetic field probes on the other side of the absorber and measure the field intensity in presence and absence of absorber.
Thank you.
hi,
i guess the question is about how to define a resistive sheet of surface resistance R ohm/sq.
In HFSS an impedance boundary can be used.
In cst you have to define a new material. select type as ohmic sheet.
hi,
for this you have to check the dielectric properties of the sheet and then make new material using this properties, then you can use and simulate it.
Yes sir I used the same steps and tried to reproduced a result which has already published but i did not get the results. @ Mondeep
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