This SAED pattern is generated for a metal semiconductor hybrid nanostructure. I can see it's not single crystalline but I am not sure how to index the planes? Could you please help?
You can try to work out the d-spacings of the strongest reflections in your electron difffraction pattern and then try to correlate those with the expected ones for your materials, however, if you have not explicitly calibrated this specific camera length you used then the values will be no more than 2-5% accurate or so (depending on the diligence of your service engineer) and so this won't help you for higher order reflections whcih are often more closely spaced and where higher accuracy may be required.
The power of electron diffraction is not the d spacing that you can calculate. It does not have the desired resolution. Even with a calibrated cameralength, you can't reach an accuracy of no more than >1 %. So if you have a large enough sample, X-ray diffraction is preferred. The advantage of electron diffraction is that you can obtain the angle between the planes for the phaseanalysis. But that requires single crystal diffraction oriented into a mayor zoneaxis. If your crystalites are too small for SAED , you can try convergent beam diffraction CBD.
Another usefull thing for SAED patterns is that you can do darkfield to link the diff spots with imaging