I am interested if any of the reliability researcher has used a methodology for optimizing the time of burn-in at a technological training of electronic components and complex systems. The methodology should take into account the magnitude of thermal overload and the level of electrical overload. It would be better to allow through it can be normalized level of reliability of the products leaving burn-in procedure.
You may wish to give some clarifications.
For this purpose I use mathematical system of two equations.
https://www.researchgate.net/publication/291355157_Problem_Areas_by_Burn-in_of_the_Electronic_Devices
The idea is not complex and is easy to apply in practice. The time for increased load bound by givoto reliability. Unfortunately, this approach to Burn-in not report the degree of electrical load timing Byrne in.
I hope that colleagues who are dealing with problems of reliability have used a comprehensive methodology that will share.
Thank you in advance for your help.
Have a nice day!
Conference Paper Problem Areas by Burn-in of the Electronic Devices
Reliability method to optimize the aging, there are only three factors --- 1 is the natural time of aging, 2 is caused by environmental factors aging, 3 is caused by human factors aging. The key is to determine the options.
Particularity and general "one to nine" principle is the answer.
Thank you Yin Zhe (y.zhe,z.yin,zhe yin),
That's right, but this does not give information about how to bind the severity of erektricheskoto and technical load with time Burn-in. If you know how to do this - you can help in solving the problem.
dear
It is an interesting and interesting question and will follow and benefit from
regards
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