How can one calculate the oxygen vacancy from XPS data? And also if annealing is used to introduce defects, what method can be the best to estimate the presence of defects? Thank you
This should help
https://www.google.com/url?sa=t&rct=j&q=&esrc=s&source=web&cd=1&cad=rja&uact=8&ved=2ahUKEwiT-_3np87eAhUI2VMKHZvmC0AQFjAAegQIAxAB&url=https%3A%2F%2Fwww.researchgate.net%2Fpost%2FHow_can_we_calculate_concentration_of_Oxygen_vacancy_by_considering_the_peak_Area_Ti3_and_Ti4_ion_in_XPS&usg=AOvVaw0VfW-BxCoChIoheQpnoDM6
Check this out,
Photoelectron spectroscopy study of oxygen vacancy on vanadium oxides surface
http://citeseerx.ist.psu.edu/viewdoc/download?doi=10.1.1.722.3014&rep=rep1&type=pdf
XPS Spectroscopy
Thank you Segun Michael Abegunde Engin Ciftyurek Abdelkader Hafdallah
XPS Spectroscopy analysis
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