I have synthesized Ti3C2Tx MXene by HF etching the Ti3AlC2 MAX phase. Further the multi-layered MXene is delaminated to get few-layered MXene flakes or layers. Is there any tool or characterization technique to quantify how many layers or flakes have been obtained through delamination? Can TEM, HR-TEM or Raman analysis techniques be applied here?

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