I am working on RRAM devices where pulsed I-V characterization is an important result to show the switching endurance of the devices. We have a Keithley 4200 SCS characterization system with SMU but without Pulse Measuring Unit (PMU). Please tell me how to perform pulsed I-V measurement without PMU card. There are UTM for RRAM endurance test but that doesn't show a reliable result as far as I understand. Please help me to sort out this issue as my work is delaying alot due to this?
As far as my experience with the keithley 4200 SCS goes, I do not think it is possible. It is like asking to play music in your computer without installing sound driver. A better solution is to use a normal signal generator, short SMA cables, and if available, an RF probe to excite your device (if it is on a bare die/wafer). And just use a nice oscilloscope to capture the data.
can you explain how to calculate program/erase time and endurance time for a 2 terminal memory device .any link so that i can understand ! we have pmu in 4200 scs with probe station
The question is what are your requirements for pulsed IV? If you want to vary the pulse-length then you will definetly need a pulse or waveform generator, as SMUs typically do not have the necessary capabilities. If you only have SMUs I would recommend to just use voltage sweeps, but you should take care that you have a constant sweep-rate (don't use autorange, as that changes the integration time during measruement). And also you should check your device far unwanted voltage spikes during measurement (look for Viktor Havel's phd thesis, https://publications.rwth-aachen.de/record/572473?ln=en)
If you definately want to perform pulsed IV measurements, my advice is to acquire a PMU, they are perfect for that task, but depending on the HRS resistance of your RRAM cell you can also use a combination of pulse/waveform-generator and oscilloscope. The disadvantage of this setup is that for high HRS resistances you would also need a pre-amplifier to get reasonable current data.
@Prasenjit: There is no easy way to calculate the program/erase times, at least not a universal one. (Article Interrelation of Sweep and Pulse Analysis of the SET Process...
) This paper includes an analytical model that was quite useful for rough estimations for write times but still needs a lot of material parameters.
It is possible using just the 4200SMU units albeit with the limitation that the minimum pulse resolution is 10 milliseconds. I could look up my code if you like.
Thanks Marsh,
That would be a great help.
Please share your codes on [email protected].
Hi Phil Marsh,
I also want perform pulse IV measurements on my devices. please share your code on [email protected].
thank you very much
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