Can you specify which error you are referring to. You will have measurement errors associated with measuring the mass of the material, scan rate, potential values, current values.
I would imagine that you would have also calculated a mean and standard deviation for multiple samples (7 or more is typical). I have found the attached article (A Summary of Error Propagation) superb for reminding me how to combine errors within equations.
Cyclic voltammetry is not the most reliable technique for measuring capacitance of supercapacitive materials.
As Marie alludes to, CV is not always a reliable indicator for the capacitance of electrochemical capacitors.
I would recommend verifying your results with another technique such as galvanostatic charge-discharge cycling.
I attach some articles that discuss the pros and cons of different techniques, why extra care should be taken in reporting certain values and why as researchers we should strive towards a more robust characterisation procedure for supercapacitive materials.