Since the sample requirement of the TEM is very small that to in a liquid form. Will it be possible to perform TEM test of fabric sample without disturbing its original structure.
It seems like it can be done somehow, although I have not access to this journal paper in my network:Article Atomic layer deposition and biocompatibility of titanium nit...
I would say that all sample preparation methods for TEM one way or another can slightly disturb the specimens; generally this is not too much of a problem.
For your specific problem, I would try the advent of the new Plasma Focused Ion Beam for TEM sample preparation. Using Xe for FIB-TEM, you will mitigate any deleterious disturbance of the first atomic layers of the material and it can assist with very fast milling rates!
Do you really need TEM with a resolution in the sub-nm scale (an a very small field of view) , or would be SEM with a resolution in the nm scale (an a field of view on µm to mm).
Because the fibres are mostly insulating for imaging preparation might be needed.
With SEM it might be possible to obtain images using low-pressure SEM may work without further preparation.
If you're interested in cross-sections of your fabric embedding in a suitable epoxy and cross-sections can be created by fracture, classical TEM preparation, or FIB cuts (depending on your needs and the tools you can access).
A starter could be: Chapter Characterization of nanocomposite coatings on textiles: A br...
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