I have a series of AFM images (with time at temperature T>Tg, glass transition) of a polymer film on Si wafer. I do see a change in surface roughness with time. Is there any method to calculate surface diffusion coefficient from surface roughness obtained from images?
What exactly you mean "diffusion coefficient" ??? AFM measure surface, making the exact map of it and AFM may illustrate changes on surface properties. It is all.
Hi Janusz,
There are some literature work on extracting surface diffusion coefficient (D)
by measuring the time decay of the surface height (roughness) on the film. Please see the attachments. In the neighborhood of Tg (glass transition) polymer chains are more mobile and there will be surface height fluctuations. I wanted to know how to calculate D from surface height fluctuations (roughness) with time.
Thank you
Taking it into consideration I can see a lot of assumptions - such as when one tell about Young modulus measure with AFM. I was searching the base of 'surface diffusion' and found It may depend on the bubble size (?). But I cant find any dependence between measured Ra and diffusion (?). Will check it later, on Monday, I think. But it still seems as assumption/math model - not measurement. Here is model: https://doi.org/10.1016/j.commatsci.2006.05.006
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