For high-resolving (angular) interpretations of EBSD patterns, e.g. for GND analysis or the characterisation of the microstructure of pseudo-symmetric phases (photovoltaic phases like I-III-VI semiconductors (chalcopyrites), domain-rich phases like perovskites etc), tiny deviations in band detection can be essential for the determination of small or even huge misorientations (differenciation between a and c axes). I wonder whether anybody seriously discussed this phenomenon as critical error source, e.g. related to the Hough resolution or pattern resolution used for the Hough transform?