For high-resolving (angular) interpretations of EBSD patterns, e.g. for GND analysis or the characterisation of the microstructure of pseudo-symmetric phases (photovoltaic phases like I-III-VI semiconductors (chalcopyrites), domain-rich phases like perovskites etc), tiny deviations in band detection can be essential for the determination of small or even huge misorientations (differenciation between a and c axes). I wonder whether anybody seriously discussed this phenomenon as critical error source, e.g. related to the Hough resolution or pattern resolution used for the Hough transform?

More Gert Nolze's questions See All
Similar questions and discussions