I have done impedance measurements of a metal-oxide-semiconductor structure as a function of the bias voltage. The radius of the impedance arc in the Nyquist plot decreases with and increase in the bias voltage. I need to understand what role this bias voltage plays in the charge transfer / transport properties of this structure, which appears as a reduction in the radius of the Nyquist plots.
Thanks Till.
My MOS structure is a two terminal device so am not sure id the same case may apply as in a mosfet. Also my measurements are impedance measurements so I thought if I can understand the transport processes in this two terminal MOS structure, then I will be able to understand my data.
The capacitance-voltage plot is an industry and research standard measurement and has been for the last 50 years.
I suggest you use textbooks rather than research gate for this simple question.
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