Please find our SXRD results of five lamellar liquid crystal. The sample was placed on the glass stage. A very strong peak happens at around 0.5 degree which makes our signal from sample (around 1.6 degree) to be week. It is hard to get reliable d value from these results.
How can I do with this? Change the sample stage?
I guess that you can use Low Angle XRD with minimum step scanning rate.
It will take a 30 ~ 60 minutes.
First you need to know where that low angle background is coming from. Collect data with no sample on the slide, and again with no sample or slide. This will tell you if it is from the slide. If it is try to mount it on something that will scatter less (for example Kapton). If you still see a large low angle background without anything in the beam, then there is a problem. Is the sample chamber in air or vacuum? If it is in air it could be air scatter. Are there any windows that could be causing scatter? If you can't get rid of this background at least you can measure it without a sample in order to subtract it from your sample measurement to improve the accuracy of fitting your peak.
Thanks a lot all guys.
We have solved the problem by selecting appropriet slit-width of both incident light and that before detctor
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