Mott-Schottky (MS) analysis is commonly employed to determine doping densities and built-in voltages in the device. Can we get the MS plot from the impedance data or there any other ways to do it? Thank you
Yes, you can get it from Impedance data. MS plot is basically Csc-2 vs V (applied potential).Thus, the Capacitance can be extracted from the imaginary part of the impedance spectra
C= 1/ w(omega)Zim
Now you have to collect the capacitance values at different potential from the impedance(Nyquist) plot.
Have a look at the attached Bio-Logic application note.
Enjoy reading.
Dear @Sujoy Sarkar,
You have answered the question very well but I have still confusion regarding how to collect capacitance values at different potential?
Kindly explain this misconception, it would be really helpful. Thank you
I remember that i conducted this experiment before. To get Mott-Schottky plot, u just plot the the inverse of square root of the capacitance obtained from impedance spectra with the applied potential (1/C2 vs V). From MS plot you can determine the flat band potential for the material.
change the DC potential, to get the potential dependent nyquist plot. Most imp thing for mott-scottky we shld consider the space charge capacitance and hence u have to fit ur nyquist plot with the equivalent circuit containing the space charge capacitance component.
Dear :
Can someone please provide me reference about how to measure capacitance from the impedance vs applied potential at one frequency?
How to do that in Gamry analysis?
Thanks
Qamar Wali Gomaa A. M. Ali Gomaa A. M. Ali To characterize an n-type thin film semiconductor with Mott-Schottky analysis, must thin film be characterized in an electrolyte solution, or do we just need to bias the layer?
Article Mott–Schottky Analysis of Photoelectrodes: Sanity Checks Are Needed
http://www.abc.chemistry.bsu.by/vi/Mott-Schottky.pdf
Dear Qamar Wali sir
kindly refer these articles.
The answers given for this particular interesting question are not really or directly answering the question as the specifications are given in the brackets. So I am still also looking for the answer as to how to convert that in M-S plots.
We have a similar problem with the Mott-Schottky plot.
We have measured our semiconductor as the working electrode with an impedance analyser (Solartron 1260A) using the Mott-Schottky method. We measured the semicircles at different potentials (V). The capacitance of a determined electrochemichemical processs is obtained from the maximum of semicircles using the equation CR=4pi f (C= capacitance; R= resistance; pi= 3.1415….; f= frequency). Then we plot the 1/(C^2) vs applied potential.
But in some cases the Mott-Schottky plot is shown for different frequency in the range of 500 - 1500 Hz. We don´t kown what capacitance values it takes at each frequency. Are the capacitance values taken directly fromm the semicircles at the corresponding frequency?
I will appreciate any feedback on this matter.
Pedro Núñez
Dear Pedro Núñez ,
this 'method' for capacitance values is not, always, reliable. You might find some 'other' (collateral) values, that are not related with this (Mott-Schottky) analysis.
If you could show Z-spectra (and/or Nyquist) for, at least, two cases with the ('Zi-high') capacitance at very different frequencies, then we might say more.
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