how can we confirm the phase of material through TEM diffraction pattern? If the calulated d-spacing is equal to the two phases d-spacing in JCPDF reference file?
Hello,
if the spacing fits to two different phases in PDF database (if I get it correctly), then you can try to measure spacing of other directions and angles between them, maybe this would clarify the results...
good luck
In SAED pattern, you can confirm whether its crystalline or amorphous material,if its crystalline based the diffraction pattern u can confirm the state of the material
Hi Mekala,
the best way is to take spot diffraction pattern from two different zone axis (at least) of the same crystal. If the crystal provide diffraction pattern with reflection arrangement common for two phases, it has very low probability to observe the same effect after tilting the sample to another zone axis.
So, if you get diffraction pattern from the first zone axis, choose the one of phases which is fitting for your pattern by crystallographic database. After that you have to calculate how size of angle you need for tilting the sample to another arbitrary zone axis. If you can´t get the zone axis diffraction pattern after tilting around calculated angle, then the phase you picked up is wrong.
I recommend you to use Kikuchi "roadmap" while tilting the sample.
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