Controlling thickness depends on a lot of parameters. There are a lot of excellent papers that you can find for spin coating P3HT:PCBM to get started. To measure thickness you should use ellipsometry for non-destructive determination of thickness. You can use AFM for destructive determination of thickness.
Ellipsometer, profilometer or even an AFM (etch away a part of your film and take the step measurement) can be used to measure the thickness thin films.
Dear colleague Dr. Amr,
Peace be up on you, your question's readers and all RG members
There three methods to check and measure film thickness; you can use one of the following according to condition of the film.
Film thickness can be checked by
1- An interferometric method, more details is available at: TOLANSKY S. Multiple beam interferometry of surfaces and films. London: Oxford University Press, 1988: 147.
2- Using mass of the film, m according to the next details::
W1 is the weight of cleaned substrate
W2 is the weight of cleaned substrate plus film
W2-W1= the weight of the film
ΔW=mg
m = ΔW/g
m=ρXV ; ρ, is the density of film material and V is the volume of the film
the Volume = (Width X Length X Thickness) of the film
3- SEM or AFM (film-substrate ) cross section
I wish this is useful and help you.
A. El-Denglawey
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