Hi folks, is there any public or private dataset for IC chip defection detection or classification? I'm working on a project of IC chip defection/anomaly detection, and is in bad need of access to any of these datasets. Please help recommend and find such one. Great thanks!
What type of integrated circuits are you interested in? A lot of problems are caused by the degradation of the isolator of floating gate Flash-NAND chips. This is the main reason for the failure of data carriers using Flash-NAND chips. Unfortunately, I don't have statistics and I don't know if these chips fall into your area of interest, but if you specify what chips are most interesting to you, I'll try to find relevant materials or people who can help.
Zhicheng Cao There are a few public datasets that may be useful for IC chip defect detection or classification. Here are a few examples:
- The MNIST dataset (http://yann.lecun.com/exdb/mnist/) is a dataset of handwritten digits that has been widely used for machine learning research. It consists of a training set of 60,000 images and a test set of 10,000 images. While it is not specifically designed for IC chip defect detection, it could potentially be used as a starting point for developing machine learning models for this purpose.
- The CIFAR-10 dataset (https://www.cs.toronto.edu/~kriz/cifar.html) is a dataset of small images that has been used for image classification tasks. It consists of 60,000 32x32 color training images and 10,000 test images, labeled over 10 categories.
- The ImageNet dataset (http://www.image-net.org/) is a large dataset of images that has been widely used for machine learning research. It consists of over 14 million images, organized into more than 20,000 categories.
Zhicheng Cao There are several datasets that might be useful for chip fault identification and classification. Here are a couple of such examples:
The International Society for Optics and Photonics (SPIE) offers a collection called the "SPIE Defect Image Database" that contains photographs of integrated circuit faults.
The National Institute of Standards and Technology (NIST) maintains a collection called the "NIST Integrated Circuit Defect Database," which contains photos and descriptions of integrated circuit flaws.
The China Silicon Industry Association (CSIA) maintains a dataset called the "CSIA Integrated Circuit Defect Database," which contains photos and descriptions of integrated circuit flaws.
I'm not sure if these datasets are open to the public, but you might be able to get them via your institution or research group. Other relevant datasets may be found by searching online or contacting groups in the semiconductor sector.
@Qamar Ul Islam, Hi Qamar, can you please provide links or means of access to the datasets you mentioned? Some of them can't be found by myself. Great thanks.
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