I would like to use kelvin probe force microscopy in order to image the charge on my sample consisting of AgNW deposited on mica. Has anyone some experience in this topic. I'm quite new to AFM and KPFM topics so I do not know if the results I obtain are valid or not. Whats more, there are no KPFM data regarding silver nanowires (or at least I was not able to find them) so I can not compare.
I attach a single measurement of the AgNW using KPFM. The thickness (real) of the AgNW is around 200 nm, so I do not know what is this, shown on the picture. Topography pictures are in good agreement with the SEM images of the investigated nanowires.
There are many factors involved in KPFM. To start with
1. How have you performed KPFM? Single pass or life mode? AM or FM ?
2. You would need a conductive substrate for KPFM. What you have shown in the image seems to be due to heavy crosstalk between topography and surface potential. MICA is not conductive and hence cannot be grounded or biased.
If you need further help please include experimental details and we can go from there.
Swami
Hi,
The potential difference scale in your Image goes from -1.0 to 13.0 V!!! This seems way too much for me. Typical potential differences are below 1 V, often smaller like 0.2 V.
Measure your mica sample (only mica) in KPFM to see if it is too insulating. Just perform a scan over the mica and change the sample bias (you need to measure absolute potential). Everytime you change the bias by 1 V, the change in your KPFM measurement should be 1 V.
Without knowing too much about your experimental details, for lift-mode operation you should do slow scanning in the beginning and keep the lift height at ca. 100 nm. Also wait for your System to stabilize in order to minimize drift.
Regards, F.
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