Which method is better for measurement of conductivity of films Four probe or IV?
I think Four probe method suits the best for conductivity measurement of thin film as use of these 4 probes (2 for current source & 2 for voltage source) reduce the contact resistant to a maximum possible extent that gives us a fine result.
This depends on basic nature of material and conditions...is material is bad conductor nd contact and lead resistance are minimized then results will be close to real..but if opposite then errors will be significant...hence four probe is needed...and if you can manage ppms facility go for van der pauw...with optimized ac or dc measures.
Following the above researchers comments, the measurements of conductance can be measured by sevetal techniques such as four-point probe, Hall effect, impedance analysis and JV characteristics. Each technique has its own advantages. You could find the details for each technique from Google search easily.
To be short, the four point probe is for a surface conductor only. The Hall effect measurements can be used for either conductors or semiconductors. JV or impedance can be used for either semiconductors or dielectrics.
Which technique would you like to use very much depends on your samples.
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