I measured Capacitance as a function of frequency of NaNO2 thin film formed by solvent cast method and I used the following relations to find dielectric constant and loss factor :
1. Dielectric constant=[ Capacitance x Film thickness]/[(8.854E-12)x Area of the sample]
2. Loss factor= [dielectric constant calculated as above]x tan delta
Dear Colleague,
we would need to know more upon the experimental conditions:
- sample size, experimental set-up, frequency range, raw capacitance and conductance measurement.
in order to eliminate the possibility of any artifact. Best regards.
Dear Mam (Vincent Mosser)
1. The thickness of the film deposited ~12mm. The sample film of NaNO2 deposited on brass substrate. From XRD of this sample film the particle size 20-50 nm is calculated
2.The dielectric studies were carried out as a function of frequency (20 Hz – 1 MHz) at room temperature using a Impedance Analyzer (model- Wayn Kerr 6500B).
3. the parameter values at some frequencies are as follows
Freq(kHz) Admittance Capacitance Conductance
0.1 3.47E-05 8.56E-08 4.55E-05
1.0 1.00E-04 2.22E-08 1.45E-04
10 3.91E-04 8.19E-09 6.00E-04
100 1.32E-03 3.11E-09 1.80E-03
1000 3.01E-03 1.00E-09 3.43E-03
10000 4.33E-03 9.33E-11 6.44E-03
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