I want to measure the work function of amorphous ALD grown Al2O3 film deposited on FTO coated Glass. Is it possible to measure the work function using XPS? I have seen several papers using UPS, and a few using XPS? does anyone have the first-hand experience in this? Also. is FTO Glass is a suitable substrate or should I use a silicon wafer?

More Rajagopalan Pandey's questions See All
Similar questions and discussions