check the site for similar question(s). It has been posted at least twice (you can also find some extensive answers I have given as well).
XRD can give information on the size of the coherently scattering domains. With the appropriate tools (definitely not Scherrer equation) you can transform this "can" into something quantitative.
Normally in nano-materials grain size is the same as crystallite size. If the nano-structure is formed through large amounts of deformation, then the original grains will subdivide into sub-grains or cells which would be the crystallite size, but after the large amount of deformation needed to form nano-sized crystallites, the original grain structure is lost. Small angle X-ray scattering (SAXS) can give you statistics on particle size and crystallite size and structure on length scales from 1nm to 10 microns, and is extremely useful for characterizing nanoscale materials on multiple length scales simultaneously, and unlike electron microscopy it is a full volume probe and non-destructive so you can perform in-situ studies that are not confined to surface structure (which is often quick different from the bulk structure due to the difference in boundary conditions, for example dislocations tend to migrate to a free surface, so surface grains will not be representative when looking at dislocation structures or plasticity effects on microstructure.
in simple words arrangement of atom in proper manner called and form a 3D structure is called grain the arrangement of grain is called single crystal arrangement of crystal called particle