Hello everyone,

As we know, in X-ray Photoelectron Spectroscopy (XPS), we collect spectra for a sample using one of several X-ray sources, such as Mg, Al, Ag, or Cr. Sometimes, we encounter an overlap between an Auger line and a photoelectron line in the spectra. To resolve this, we can switch to another X-ray source to shift the Auger peak. My question is: wouldn't this influence the information we obtain from the spectra?

I believe that this does not cause any misinformation about your sample because we are using XPS, not Auger Electron Spectroscopy (AES). What's your take on this? I'm looking forward to your insights and thank you in advance for your answers!

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