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As far as i know, researchers are measure the Vth or Vdsat of MOSFET about NBTI. But, how can i get the VTC characterization of Cell in read operation? Thanks a lot !
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How can i get the parameter-VDDmin of SRAM bitcell? When i measure VDDmin is in read operation or write operation? In addition, if i want to get parameter-VDDmin, it is just scan the VDD from...
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