5 Questions 16 Answers 0 Followers
Questions related from Venkanna Kanneboina
In IBC-SHJ solar cells, ARC is deposited on front side of c-Si and both emitter (i-a-Si:H / p-type a-Si:H / TCO / metal) and back surface filed (BSF)(i-a-Si:H /n-type a-Si:H / TCO / metal) were...
02 November 2018 5,846 5 View
I have fabricated Ag/p a-Si:H/i a-Si:H/p-c-Si/i a-Si:H/n a-Si:H/ITO/Ag solar cell by PECVD, i a-SI:H layer thickness iis about 5 nm, p,n a-Si:H thickness is about 10nm, ITO (by sputtering)is 80nm...
22 May 2016 3,011 13 View
While using AFORS HET 2.4.1 software one error is coming, I could not understand that error, I have attached here error jpg file . Any one have user manual of this software ?
10 November 2014 5,515 6 View
I want to fit Tauc-Lorentz model for measuring film thickness, refractive index, Band gap and imaginary part of dilectric constant etc. of a-Si:H film using spectroscopic ellipsometry (im using...
20 October 2014 1,646 2 View
Please anyone can explain how to analyze Spectroscopic ellipsometry data for a-Si:H films ? band gap, thickness and refractive index etc ? which model will suitable and how to fit with that model...
25 August 2014 9,220 4 View