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Aluminum oxide is used for n-type silicon solar cell for passivation. But, which has greater impact on passivation: ALD or PECVD aluminum oxide?
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I have prepared a thin film on silicon. The film is basically amorphous with some crystalline phase. Therefore, a HRTEM analysis is very much essential to confirm crystal growth. But at present...
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What should be the peak position of C-N stretching vibration in Si-C-N, C-N-C, and C-N=C groups for silicon carbonitride thin film?
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Generally, we have observed thin film interference patterns (maxima and minima) in FTIR spectra, which are measured in T mode for sufficiently thick film (few micrometers) on silicon. However, is...
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