The attached C-V measurements are for a metal-insulator-metal sample comprising a metal-rich TaOx layer. Can anyone assist with interpretation?

The attached capacitance-voltage curves were measured for a Pt/TaOx/Pt metal-insulator-metal capacitor.  The insulating layer is sub-stoichiometric.  The change in curvature with frequency likely...

25 March 2017 6,167 3 View