Naval Kishore Mehta | Central Electronics Engineering Research Institute

Naval Kishore Mehta

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Questions related from Naval Kishore Mehta

Can we use IR or Raman spectroscopy to gather information about point defects in a thin film deposited or annealed at different temperatures?

By analyzing the spectra, it is feasible to infer the occurrence of broken bonds, indicating the presence of defects within the material.

01 April 2017 3,489 6 View

An extra peak of Iron(III) oxide was found in the XRD after annealing the Mn ferrite thin film deposited at room T using PLD technique?

What factors might account for this phenomenon?

30 March 2017 5,820 6 View