Martin Herms

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Questions related from Martin Herms

How can I calculate the stress field of a 60 degree dislocation in Si and GaAs?

Does know somebody the stress or strain field of 60 degree dislocations in Si and/or GaAs? The stress fields of single edge and screw dislocations are well-known. However, what is about 60 degree...

09 September 2018 3,747 0 View

Dear colleagues! Do you know that our SIRD has been used for many years for detecting near edge defects in Si wafers icluding microcracks?

Details of defect regognition and image processing in Si wafers by using SIRD and SIREX are available, e. g. published in several papers and application notes. Do not hesitate to ask for sending them!

01 January 1970 9,363 3 View

Hello Rajko! Are you intersted in test measurements by SIREX in view of the suitibility for evaluation of mc-Si?

After the promising study of Diamond wire sawn mono-crystalline Wafers by SIREX a comparative investigation of mc-Si Wafers seems to be reasonable. Do you agree? :)

01 January 1970 5,021 0 View