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I have been asked to find the uncertainties (lattice parameters and atomic positions) of the XRD data I had refined, I've seen that it is possible using the GSAS EXPGUI software, so is the same...
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I've been trying to obtain the cell parameters of CeVO4 and SmVO4 from rietveld refinement of XRD data. However the peaks seem to disappear after refining U, V, W parameters in Full-Prof software...
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