Minority carrier lifetime is a very important parameter for optoelectronic materials used for different photonic devices, such as solar cells or light emitting diode. It is observed that both the photo-current transient and time resolved photo-luminescence (TRPL) have been used to determine the said parameter.

My inquiry is which one is more accurate? Is there any effect (perturbation) of applied bias/ metal contact in case of transient photo-current process while measuring the minority carrier lifetime?

Which factors (and why) lured people to use contactless TRPL to calculate the same parameter?

Similar questions and discussions