Hola ! I would like to know if you can suggest me a model to fit data from GaAsN samples between 250 up to 1600 nm.
Simone Privitera-Uno To fit ellipsometry measurements from 250 to 1600 nm on GaAsN samples, consider using a combination of models that suit the optical properties of the material. The Tauc-Lorentz Model, which combines the Tauc model for absorption with Lorentz oscillators for the dielectric response, can be extended to include multiple oscillators, making it suitable for capturing complex behavior of materials like GaAsN. The Sellmeier Model, an empirical model that describes the refractive index as a function of wavelength, may be relevant for certain wavelength ranges. The Drude-Lorentz Model, which includes both free-carrier and phonon contributions, might be suitable for samples with strong absorption features. The choice of models and parameters depends on the specific features of the GaAsN samples. You can utilize tools such as CompleteEASE, WVASE32, or DeltaPsi2 to fit the model to your data. They frequently include tools for fitting ellipsometry data and obtaining material properties.
Thank you very much ! I fitted very well my experimental data by using Cauchy model in the transparency. Now it is more tricky to fit all the spectral range ! Do you know about WvlByWvl model available in CompleteEASE Alvena Shahid ?
Dear Simone Privitera-Uno , have you tried to build the General Oscillator after PtbyPt fit? This will alow you to fit the epsilon2 or epsilon1 (or both) by suitable model (models) – e.g. as mentioned by Alvena by Tauc-Lorentz + Drude model if needed, etc.
Do you know why the extinction ratio k output of my fitting experimental data of GaAs using WvlByWvlt does not converge to 0 as expected in transparency ?
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