I am working with electroluminescence (EL) imaging of photovoltaic panels and need to ensure that the modules are not damaged during testing. I understand that the bias current is usually set based on the short-circuit current (Isc), often as a percentage of it.
However, I have not found concrete information on the safe current range that can be applied without risking damage to the panel. I would like to know if there is a consensus or specific standard regarding the maximum current that can be applied during EL testing. Any normative references, practical experiences, or specific recommendations to ensure the integrity of the modules during these tests would be greatly appreciated.
The best way according to the recommendation is to limit current to less than 90% of the short circuit current [Isc] of the panel to ensure its safety and integrity during testing.
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