Generally, the beam current increases with increment in energy of electron beam during LEED analysis. But in my case, it follows the opposite trend. Kindly suggest reasons, if any.
Firstly by beam current do you mean the emission current from the filament or the current measured at the sample?
If it is the former it is just how the instrument was designed, the acceleration voltage is in such a position that it negates some of the effectiveness of the extraction bias. If is it the later you may be able to optimize the alignment plates to increase the current (if your set-up has such plates). You should also be able to contact the company the made the LEEDS and see what they suggest, or the company that now owns the production.
Finally if the signal is too low for your measurement what you may be able to do is gather multiple LEEDS spectra and sum them with software like ImageJ.
Thanks Christopher. The beam current means the current measured at the sample for analysis.
Thanks Artur. Generally the LEED spots are known to give the diffraction spots in the energy range between 30 eV and 300 eV. In my case, i am able to detect some spots at high beam energy around 400 eV but it is blurred. I am not able to confirm that whether it is actually LEED spots or saturated pixels. At lower beam energy, Iam not able to detect any spots.
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